SOFI-based 3D superresolution sectioning with a widefield microscope

Original article

Thomas Dertinger^*, Jianmin Xu, Omeed F Naini, Robert Vogel and Shimon Weiss^*

* Corresponding authors: Thomas Dertinger thomas.dertinger@gmail.com - Shimon Weiss sweiss@chem.ucla.edu

Optical Nanoscopy 2012, 1:2 doi:10.1186/2192-2853-1-2

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