A novel nanoscopic tool by combining AFM with STED microscopy
- Equal contributors
1 Nanophysics, Istituto Italiano di Tecnologia, via Morego 30, 16163, Genova, Italy
2 JPK Instruments AG, Bouchéstrasse 12, 12435, Berlin, Germany
3 Department of Physics, University of Genoa, 16146, Genoa, Italy
Optical Nanoscopy 2012, 1:3 doi:10.1186/2192-2853-1-3Published: 25 April 2012
We present a new instrument for nanoscopic investigations by coupling an atomic force microscope (AFM) with a super resolution stimulated emission depletion (STED) microscope. This nanoscopic tool allows high resolution fluorescence imaging, topographical imaging and nano-mechanical imaging, such as, stiffness. Results obtained from technical and biological samples are shown illustrating different functions and the versatility of the presented tool. We assert that, this highly precise tractable tool paves the way to a new set of comprehensive studies in medicine, biology and materials science.