A novel nanoscopic tool by combining AFM with STED microscopy

Original article

Benjamin Harke^*^†, Jenu V Chacko^†, Heiko Haschke, Claudio Canale and Alberto Diaspro^*

* Corresponding authors: Benjamin Harke benjamin.harke@iit.it - Alberto Diaspro alberto.diaspro@iit.it
† Equal contributors

Optical Nanoscopy 2012, 1:3 doi:10.1186/2192-2853-1-3

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